Journal
CHEMICAL PHYSICS LETTERS
Volume 806, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.cplett.2022.140003
Keywords
Z-dependence; Forward scattering; Photoelectron diffraction; Photoelectron holography; HAADF-STEM
Funding
- JSPS [26105001]
- Toyota Physical and Chemical Research Institute
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The dependence of forward scattering peak intensity on Z and the value of alpha were discussed in this article. It was found that Z-dependence plays a significant role in elemental analysis.
The dependence of the forward scattering peak intensity I on Z was considered as the power law I? Z(alpha), and the value of alpha was discussed. Using the Yukawa potential and the first Born approximation alpha = 2 is obtained as in the Z(2) contrast of the HAADF-STEM. The simulation shows alpha at E-k = 600 eV and 30 keV are about 1/2 and 1, respectively. Z-dependence of the screening constant could explain alpha = 1 at E-k = 30 keV. This knowledge of Z dependence will help elemental analysis in photoelectron holography.
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