Journal
JOURNAL OF MEDICAL IMAGING
Volume 9, Issue 3, Pages -Publisher
SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
DOI: 10.1117/1.JMI.9.3.031501
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The guest editors of JMI present articles from the Special Section on Hard X-Ray Tomography with Micrometer Resolution, providing an overview of this significant niche area in the field of hard x-ray tomography at the micrometer level.
JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level.
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