Transfer of Durable Stripe Rust Resistance Gene Yr39 into Four Chinese Elite Wheat Cultivars Using Marker-Assisted Selection

Wheat gene Yr39 confers durable high-temperature adult-plant (HTAP) resistance to stripe rust caused by Puccinia striiformis f. sp. tritici, one of the most destructive diseases of wheat worldwide. The objective of this study was to transfer Yr39 into four Chinese elite wheat cultivars. Backcross inbred line populations were developed from four Chinese wheat cultivars Chuanmai 42 (CM42), Bainong Aikang 58 (AK58), Han 6172 (H6172) and Zhengmai 9023 (ZM9023) crossed with a Yr39 single-gene line. The F-1, BC1F1 and BC1F6 lines were genotyped using resistance gene analogs polymorphism (RGAP) markers Xwgp36, Xwgp44 and Xwgp43, which are closely linked to Yr39. Progeny lines selected with the markers for Yr39 were evaluated in the field for stripe rust resistance and agronomic traits including plant height, tiller numbers, spike grain numbers and thousand-grain weight. Eleven lines were selected with stripe rust resistance and desirable agronomic traits. These lines with production potential can be used for further testing in various wheat production regions and as germplasm resources for breeding new wheat cultivars with durable stripe rust resistance, high yield, and adaptation to different production environments.

Automated summary

In this study, the wheat gene Yr39 was successfully transferred into four Chinese elite wheat cultivars, resulting in the development of 11 selected lines with stripe rust resistance and desirable agronomic traits. These lines offer potential for further testing in different wheat production regions and can serve as germplasm resources for breeding new wheat cultivars with durable stripe rust resistance, high yield, and adaptation to different production environments.