Journal
OPTICA
Volume 9, Issue 8, Pages 894-902Publisher
Optica Publishing Group
DOI: 10.1364/OPTICA.462586
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Funding
- Air Force Office of Scientific Research [FA9550-20-1-0143]
- National Science Foundation [2010359]
- NVIDIA (Academic Hardware Grant Program)
- H2020 European Research Council [851154]
- European Research Council [ENIGMA 789116]
- European Research Council (ERC) [851154] Funding Source: European Research Council (ERC)
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This paper presents a reference-free, full-field, single-shot spatiospectral measurement technique called broadband single-shot ptychography (BBSSP). BBSSP provides the complex wavefront for each spectral and polarization component in an ultrafast pulse-beam and should be applicable across the electromagnetic spectrum. BBSSP will dramatically improve the application and mitigation of spatiospectral pulse-beam structure.
High-intensity pulse-beams are ubiquitous in scientific investigations and industrial applications ranging from the generation of secondary radiation sources (e.g., high harmonic generation, electrons) to material processing (e.g., micromachining, laser-eye surgery). Crucially, pulse-beams can only be controlled to the degree to which they are characterized, necessitating sophisticated measurement techniques. We present a reference-free, full-field, single-shot spatiospectral measurement technique called broadband single-shot ptychography (BBSSP). BBSSP provides the complex wavefront for each spectral and polarization component in an ultrafast pulse-beam and should be applicable across the electromagnetic spectrum. BBSSP will dramatically improve the application and mitigation of spatiospectral pulse-beam structure. (C) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
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