4.3 Article

GenX 3: the latest generation of an established tool

Journal

JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 55, Issue -, Pages 1063-1071

Publisher

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600576722006653

Keywords

reflectometry; surface X-ray diffraction; neutron analysis; X-ray analysis

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This article presents the evolution and new features of the GenX software over the past 15 years. The software has improved the ability to analyze X-ray and neutron reflectometry data through features like a simplified model builder and statistical error analysis.
Since its publication more than 15 years ago the GenX software has been continuously developed and has established itself as a standard package for analyzing X-ray and neutron reflectometry data. The evolution of the software during the last two major revisions is reported here. This includes a simplified model builder for beginners, simple samples, additional sample models, statistical error analysis and the use of just-in-time compilation modules for the reflectometry kernel to achieve higher performance. In addition, the influence of experimental errors on the reflectivity curve is discussed, and new features are described that allow the user to include these in the error statistics to improve the fitting and uncertainty estimation.

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