4.7 Article

Andreev Reflection in the Fractional Quantum Hall State

Journal

PHYSICAL REVIEW X
Volume 12, Issue 2, Pages -

Publisher

AMER PHYSICAL SOC
DOI: 10.1103/PhysRevX.12.021057

Keywords

-

Funding

  1. Rubicon grant of the Netherlands Organization for Scientific Research (NWO)
  2. DOE [DE-SC0019300, DE-SC0012260]
  3. NSF [DMR-1708688, QII-TAQS MPS 1936263]
  4. Institute for Basic Science [IBS-R011-D1]
  5. Simons Collaboration on Ultra-Quantum Matter from the Simons Foundation [651440]
  6. Science and Technology Center for Integrated Quantum Materials, NSF [DMR-1231319]
  7. Elemental Strategy Initiative by the MEXT, Japan [JPMXP0112101001]
  8. JSPS KAKENHI [19H05790, JP20H00354]
  9. NSF NNIN Grant [ECS-00335765]

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Researchers have successfully constructed graphene-based van der Waals devices with narrow superconducting niobium nitride (NbN) electrodes. The study reveals the coexistence of superconductivity and a robust fractional quantum Hall (FQH) state in these devices. Additionally, the study identifies a possible signature for crossed Andreev reflection (CAR) across the superconductor, separating two FQH edges.
We construct high-quality graphene-based van der Waals devices with narrow superconducting niobium nitride (NbN) electrodes, in which superconductivity and a robust fractional quantum Hall (FQH) state coexist. We find a possible signature for crossed Andreev reflection (CAR) across the superconductor separating two FQH edges. Our observed CAR probabilities in the particlelike fractional fillings are markedly higher than those in the integer and hole-conjugate fractional fillings and depend strongly on temperature and magnetic field unlike the other fillings. Further, we find a filling-independent CAR probability in integer fillings, which we attribute to spin-orbit coupling in NbN allowing for Andreev reflection between spin-polarized edges. These results provide a route to realize novel topological superconducting phases in FQH-superconductor hybrid devices based on graphene and NbN.

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