Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 46, Issue 1, Pages 413-417Publisher
SPRINGER
DOI: 10.1007/s11664-016-4863-0
Keywords
Absorber; defect; metamaterial; reflection coefficient
Categories
Funding
- Vietnam National Foundation for Science and Technology Development [103.99-2011.02]
Ask authors/readers for more resources
We present a simple method to achieve a multiband perfect metamaterial absorber for use in the K band by applying defects to the absorber structure. Open boundary conditions with an excitation port are used for simulation of the whole considered structure. A defect was then introduced into the structure to obtain multiband absorption. Two perfect absorption peaks were observed at 19.8 GHz and 23.1 GHz for the structure with a defect of 2 x 2 unit cells. The multiple resonance frequencies could be tuned by varying the defect dimensions. In addition, it was found that the absorber structure is insensitive to the polarization angle of the incident electromagnetic wave over a wide range due to the symmetry of the configuration. This represents a simpler method to create a multifrequency absorber compared with previous works. To the best of our knowledge, this is the first study considering the influence of structural defects on the absorption frequencies of a metamaterial absorber.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available