Journal
FRONTIERS OF PHYSICS
Volume 17, Issue 5, Pages -Publisher
HIGHER EDUCATION PRESS
DOI: 10.1007/s11467-022-1171-4
Keywords
metal/semiconductor junction; plasmonic material; hot-carrier generation; lifetime and mean free path; injection efficiency
Categories
Funding
- National Natural Science Foundation of China [61875143, 61905170, 62075146, 11574223]
- Natural Science Foundation of Jiangsu Province [BK20180042, BK20181169, BK20190816]
- Natural Science Foundation of the Jiangsu Higher Education Institutions of China [17KJA480004]
- Priority Academic Program Development (PAPD) of Jiangsu Higher Education Institution
- Ningbo University
- Yongjiang Recruitment Project [432200942]
Ask authors/readers for more resources
Through first-principles calculation and Monte Carlo simulation, this study suggests that TiN could be a promising plasmonic material for high-efficiency hot-carrier applications, showing advantages over Au in hot-carrier generation and transport, especially high hot-carrier injection efficiency in core/shell structures.
Improving the performance of generation, transport and injection of hot carriers within metal/semiconductor junctions is critical for promoting the hot-carrier applications. However, the conversion efficiency of hot carriers in the commonly used noble metals (e.g., Au) is extremely low. Herein, through a systematic study by first-principles calculation and Monte Carlo simulation, we show that TiN might be a promising plasmonic material for high-efficiency hot-carrier applications. Compared with Au, TiN shows obvious advantages in the generation (high density of low-energy hot electrons) and transport (long lifetime and mean free path) of hot carriers. We further performed a device-oriented study, which reveals that high hot-carrier injection efficiency can be achieved in core/shell cylindrical TiN/TiO2 junctions. Our findings provide a deep insight into the intrinsic processes of hot-carrier generation, transport and injection, which is helpful for the development of hot-carrier devices and applications.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available