4.5 Article

Development of an operando characterization stage for multi-modal synchrotron x-ray experiments

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 93, Issue 6, Pages -

Publisher

AIP Publishing
DOI: 10.1063/5.0087050

Keywords

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Funding

  1. U.S. Department of Energy (DOE) [DE-EE0008163]
  2. U.S. DOE [DE-AC36-08GO28308]
  3. DOE Office of Science by Argonne National Laboratory [DE-AC02-06CH11357]
  4. U.S. DOE Office of Energy Efficiency and Renewable Energy Solar Energy Technologies Office
  5. Deutsches Elektronen-Synchrotron (DESY)

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Micro- and nanoscale inhomogeneities have a significant impact on the performance of thin-film solar cell absorbers. A characterization stage has been developed to enable multi-scale, multi-modal operando measurements, facilitating the correlation between different material properties across length scales and measurement modalities.
It is widely accepted that micro- and nanoscale inhomogeneities govern the performance of many thin-film solar cell absorbers. These inhomogeneities yield material properties (e.g., composition, structure, and charge collection) that are challenging to correlate across length scales and measurement modalities. The challenge is compounded if a correlation is sought during device operation or in conditions that mimic aging under particular stressors (e.g., heat and electrical bias). Correlative approaches, particularly those based on synchrotron x-ray sources, are powerful since they can access several material properties in different modes (e.g., fluorescence, diffraction, and absorption) with minimal sample preparation. Small-scale laboratory x-ray instruments have begun to offer multi-modality but are typically limited by low x-ray photon flux, low spatial resolution, or specific sample sizes. To overcome these limitations, a characterization stage was developed to enable multi-scale, multi-modal operando measurements of industrially relevant photovoltaic devices. The stage offers compatibility across synchrotron x-ray facilities, enabling correlation between nanoscale x-ray fluorescence microscopy, microscale x-ray diffraction microscopy, and x-ray beam induced current microscopy, among others. The stage can accommodate device sizes up to 25 x 25 mm(2), offering access to multiple regions of interest and increasing the statistical significance of correlated properties. The stage materials can sustain humid and non-oxidizing atmospheres, and temperature ranges encountered by photovoltaic devices in operational environments (e.g., from 25 to 100 degrees C). As a case study, we discuss the functionality of the stage by studying Se-alloyed CdTe photovoltaic devices aged in the stage between 25 and 100 degrees C.

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