Optimal nonlinear Stokes-Mueller polarimetry for multi-photon processes

In this Letter, we present an optimization model for nonlinear Stokes-Mueller polarimetry (SMP) to improve the precision in estimating the nonlinear Mueller matrix (MM) for two- and three-photon processes. Although nonlinear polarimeters can measure the polarization properties of multi-photon processes or materials, existing methods are suboptimal, leading to low measurement precision. Based on the model and its solution, we have designed a new measurement strategy to substantially reduce the estimation variance of nonlinear MM coefficients by approximately 58.2% for second-harmonic generation polarimetry and 78.7% for third-harmonic generation polarimetry. The model and measurement method can be directly applied to multiphoton processes to improve the precision of SMP. (C) 2022 Optica Publishing Group

Automated summary

This Letter presents an optimization model for nonlinear Stokes-Mueller polarimetry (SMP) to improve the precision in estimating the nonlinear Mueller matrix (MM) for two- and three-photon processes. A new measurement strategy is designed based on the model and its solution, which significantly reduces the estimation variance and improves the measurement precision of nonlinear polarimeters for second- and third-harmonic generation processes.