Journal
OPTICS LETTERS
Volume 47, Issue 16, Pages 4083-4086Publisher
Optica Publishing Group
DOI: 10.1364/OL.467590
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- Ministero dell'Istruzione, dell'Universita e della Ricerca [PRIN PELM] [20177 PSCKT]
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This study theoretically demonstrates that interferometric excitation combined with a cavity ringdown method can be used to measure the ultimate quality factor (Q) of microresonators (MRs). Under suitable conditions, the resonant doublet merges into a single Lorentzian, allowing for typical exponential decay in the charging and discharging time of the MR to estimate its ultimate Q by measuring the photon lifetime.
Microresonators (MRs) are key components in integrated optics. As a result, the estimation of their energy storage capacity as measured by the quality factor (Q) is crucial. However, in MRs with high/ultrahigh Q, the wall-surface roughness dominates the intrinsic Q and generates a coupling between counter-propagating modes. This splits the usual sharp single resonance and makes the use of classical methods to assess Q difficult. Here, we theoretically show that an interferometric excitation can be exploited in a cavity ringdown (CRD) method to measure the ultimate Q of a MR. In fact, under suitable conditions, the resonant doublet merges into a single Lorentzian, and the time dynamics of the MR assumes the usual behavior of a single-mode resonator unaffected by backscattering. This allows us to obtain a typical exponential decay in the charging and discharging time of the MR, and thus, to estimate its ultimate Q by measuring the photon lifetime. (C) 2022 Optica Publishing Group
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