☆ 4.6 Article

Rapid aberration correction for diffractive X-ray optics by additive manufacturing

OPTICS EXPRESS (2022)

Related references

Note: Only part of the references are listed.

Article Multidisciplinary Sciences

Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples

Mikhail Lyubomirskiy et al.

Summary: This study successfully overcomes the difficulty of separating superimposed signals from different beams in multibeam scanning by encoding each probing beam with its own X-ray phase plate. The comparison between coded multibeam scans and uncoded multibeam and single beam scans demonstrates enhanced performance on a microchip sample with regular and repeating structures.

SCIENTIFIC REPORTS (2022)

Add to Collection

Article Instruments & Instrumentation

Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRA III

K. Glazyrin et al.

Summary: This article introduces new developments in X-ray diffraction instrumentation under high pressure conditions, including focusing the X-ray beam to the sub-micrometer level, controlling the aberrations of the focusing compound refractive lenses, and a new sample alignment system. These technical developments contribute to high-pressure scientific research, improving signal-to-noise ratio and data collection accuracy.

JOURNAL OF SYNCHROTRON RADIATION (2022)

Add to Collection

Article Physics, Applied

Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Felix Wittwer et al.

Summary: The use of multi-beam ptychography and 3D nanoprinted x-ray optics allows for high spatial resolution imaging of large sample areas. This method enables parallel imaging of samples using multiple mutually incoherent beams, enhancing imaging efficiency.

APPLIED PHYSICS LETTERS (2021)

Add to Collection

Article Instruments & Instrumentation

Off-axis multilayer zone plate with 16 nm x 28 nm focus for high-resolution X-ray beam induced current imaging

Jakob Soltau et al.

Summary: By using multilayer zone plates (MZPs), focal spot sizes of less than 10 nm can be achieved, but the need for order-sorting apertures limits practical working distances. To overcome this issue, off-axis illumination of a circular MZP is introduced to balance between working distance and focal spot size. Ultimately, sub-10 nm focusing with high resolution can be achieved.

JOURNAL OF SYNCHROTRON RADIATION (2021)

Add to Collection

Article Chemistry, Multidisciplinary

PtyNAMi: ptychographic nano-analytical microscope

Andreas Schropp et al.

JOURNAL OF APPLIED CRYSTALLOGRAPHY (2020)

Add to Collection

Article Instruments & Instrumentation

Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques

Frank Seiboth et al.

JOURNAL OF SYNCHROTRON RADIATION (2020)

Add to Collection

Article Optics

A ray-trace analysis of x-ray multilayer Laue lenses for nanometer focusing

H. N. Chapman et al.

JOURNAL OF OPTICS (2020)

Add to Collection

Article Instruments & Instrumentation

Correction of the X-ray wavefront from compound refractive lenses using 3D printed refractive structures

Vishal Dhamgaye et al.

JOURNAL OF SYNCHROTRON RADIATION (2020)

Add to Collection

Article Optics

Ptychographic characterization of polymer compound refractive lenses manufactured by additive technology

M. Lyubomirskiy et al.

OPTICS EXPRESS (2019)

Add to Collection

Article Optics

Adaptable refractive correctors for x-ray optics

David Laundy et al.

OPTICA (2019)

Add to Collection

Review Optics

X-ray ptychography

Franz Pfeiffer

NATURE PHOTONICS (2018)

Add to Collection

Article Optics

X-ray focusing with efficient high-NA multilayer Laue lenses

Sasa Bajt et al.

LIGHT-SCIENCE & APPLICATIONS (2018)

Add to Collection

Article Optics

Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges

Hanfei Yan et al.

OPTICS EXPRESS (2017)

Add to Collection

Article Multidisciplinary Sciences

Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Frank Seiboth et al.

NATURE COMMUNICATIONS (2017)

Add to Collection

Proceedings Paper Optics

Aberration Correction for Hard X-ray Focusing at the Nanoscale

Frank Seiboth et al.

ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS XII (2017)

Add to Collection

Article Physics, Applied

Fabrication and efficiency measurement of a Mo/C/Si/C three material system multilayer Laue lens

A. Kubec et al.

APPLIED PHYSICS LETTERS (2017)

Add to Collection

Proceedings Paper Optics

Quantitative Characterization of Aberrations in X-ray Optics

Frank Seiboth et al.

ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS XI (2016)

Add to Collection

Article Instruments & Instrumentation

Eiger: a single-photon counting x-ray detector

I. Johnson et al.

JOURNAL OF INSTRUMENTATION (2014)

Add to Collection

Review Physics, Applied

Hard x-ray nanofocusing by multilayer Laue lenses

Hanfei Yan et al.

JOURNAL OF PHYSICS D-APPLIED PHYSICS (2014)

Add to Collection

Article Multidisciplinary Sciences

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

Andreas Schropp et al.

SCIENTIFIC REPORTS (2013)

Add to Collection

Proceedings Paper Instruments & Instrumentation

Multilayer Laue Lenses with Focal Length of 10 mm

S. Braun et al.

11TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI 2012) (2013)

Add to Collection

Article Optics

Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

Susanne Hoenig et al.

OPTICS EXPRESS (2011)

Add to Collection

Article Physics, Multidisciplinary

Breaking the 10 nm barrier in hard-X-ray focusing

Hidekazu Mimura et al.

NATURE PHYSICS (2010)

Add to Collection

Article Instruments & Instrumentation

Hard X-ray nanoprobe at beamline P06 at PETRA III

Christian G. Schroer et al.

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT (2010)

Add to Collection

Article Microscopy

An improved ptychographical phase retrieval algorithm for diffractive imaging

Andrew M. Maiden et al.

ULTRAMICROSCOPY (2009)

Add to Collection

© Peeref 2019-2024. All rights reserved.