Journal
OPTICS EXPRESS
Volume 30, Issue 18, Pages 33022-33034Publisher
Optica Publishing Group
DOI: 10.1364/OE.470704
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Funding
- Directorate for Computer and Information Science and Engineering [IIS-1763689]
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This paper presents an absolute phase unwrapping method for high-speed three-dimensional shape measurement. By using a set of three phase-shifted patterns and one binary random pattern on a structured light system, the proposed method achieves high-speed and high-quality measurement of complex scenes.
This paper presents an absolute phase unwrapping method for high-speed three-dimensional (3D) shape measurement. This method uses three phase-shifted patterns and one binary random pattern on a single-camera, single-projector structured light system. We calculate the wrapped phase from phase-shifted images and determine the coarse correspondence through the digital image correlation (DIC) between the captured binary random pattern of the object and the pre-captured binary random pattern of a flat surface. We then developed a computational framework to determine fringe order number pixel by pixel using the coarse correspondence information. Since only one additional pattern is used, the proposed method can be used for high-speed 3D shape measurement. Experimental results successfully demonstrated that the proposed method can achieve high-speed and high-quality measurement of complex scenes. (C) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
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