4.6 Article

Frequency behavior of AlInAsSb nBn photodetectors and the development of an equivalent circuit model

Journal

OPTICS EXPRESS
Volume 30, Issue 14, Pages 25262-25276

Publisher

Optica Publishing Group
DOI: 10.1364/OE.457057

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Funding

  1. National Science Foundation [ECCS-1933836]
  2. Defense Advanced Research Projects Agency [W911NF-171-0065]
  3. Army Research Office [W911NF-17-1-0065]

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The frequency response of Al0.3InAsSb/Al0.7InAsSb nBn photodetectors is reported. It is found that the bandwidth of the photodetectors is limited by the diffusion capacitance, while the photocurrent has little effect on the bandwidth.
We report the frequency response of Al0.3InAsSb/Al0.7InAsSb nBn photodetectors. The 3-dB bandwidth of the devices varies from similar to 150 MHz to similar to 700 MHz with different device diameters and saturates with bias voltage immediately after the device turn on. A new equivalent circuit model is developed to explain the frequency behavior of nBn photodetectors. The simulated bandwidth based on the new equivalent circuit model agrees well with the bandwidth and the microwave scattering parameter measurements. The analysis reveals that the limiting factor of the bandwidth of the nBn photodetector is the large diffusion capacitance caused by the minority carrier lifetime and the device area. Additionally, the bandwidth of the nBn photodetector is barely affected by the photocurrent, which is found to be caused by the barrier structure in the nBn photodetector. (C) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement

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