Related references
Note: Only part of the references are listed.Experimental analysis of tip vibrations at higher eigenmodes of QPlus sensors for atomic force microscopy
Michael G. Ruppert et al.
NANOTECHNOLOGY (2022)
Present and Future of Surface-Enhanced Raman Scattering
Judith Langer et al.
ACS NANO (2020)
Nanoscale Excitation Dynamics of Carbon Nanotubes Probed with Photoinduced Force Microscopy
Bongsu Kim et al.
JOURNAL OF PHYSICAL CHEMISTRY C (2020)
The qPlus sensor, a powerful core for the atomic force microscope
Franz J. Giessibl
REVIEW OF SCIENTIFIC INSTRUMENTS (2019)
Nanoscale spectroscopic origins of photoinduced tip-sample force in the midinfrared
Junghoon Jahng et al.
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA (2019)
Tip-Enhanced Thermal Expansion Force for Nanoscale Chemical Imaging and Spectroscopy in Photoinduced Force Microscopy
Junghoon Jahng et al.
ANALYTICAL CHEMISTRY (2018)
Photoinduced Tip-Sample Forces for Chemical Nanoimaging and Spectroscopy
Brian T. O'Callahan et al.
NANO LETTERS (2018)
Contrast and imaging performance in photo induced force microscopy
Mohammad Almajhadi et al.
OPTICS EXPRESS (2017)
Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures
Ferdinand Huber et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2017)
The Model Analysis of a Complex Tuning Fork Probe and Its Application in Bimodal Atomic Force Microscopy
Zhichao Wu et al.
APPLIED SCIENCES-BASEL (2017)
Calibration of higher eigenmodes of cantilevers
Aleksander Labuda et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2016)
A virtual instrument to standardise the calibration of atomic force microscope cantilevers
John E. Sader et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2016)
Nanoscale chemical imaging by photoinduced force microscopy
Derek Nowak et al.
SCIENCE ADVANCES (2016)
Determination of the static spring constant of electrically-driven quartz tuning forks with two freely oscillating prongs
Laura Gonzalez et al.
NANOTECHNOLOGY (2015)
A Unique Self-Sensing, Self-Actuating AFM Probe at Higher Eigenmodes
Zhichao Wu et al.
SENSORS (2015)
A simple method for the determination of qPlus sensor spring constants
John Melcher et al.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2015)
Exciton Binding Energy of Monolayer WS2
Bairen Zhu et al.
SCIENTIFIC REPORTS (2015)
Imaging Nanoscale Electromagnetic Near-Field Distributions Using Optical Forces
Fei Huang et al.
SCIENTIFIC REPORTS (2015)
Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers
Jason P. Killgore et al.
NANOTECHNOLOGY (2014)
Gradient and scattering forces in photoinduced force microscopy
Junghoon Jahng et al.
PHYSICAL REVIEW B (2014)
The emergence of multifrequency force microscopy
Ricardo Garcia et al.
NATURE NANOTECHNOLOGY (2012)
Spring constant calibration of atomic force microscope cantilevers of arbitrary shape
John E. Sader et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2012)
Spring constant of a tuning-fork sensor for dynamic force microscopy
Dennis van Voerden et al.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2012)
Image force microscopy of molecular resonance: A microscope principle
I. Rajapaksa et al.
APPLIED PHYSICS LETTERS (2010)
Calibration of higher eigenmode spring constants of atomic force microscope cantilevers
Jose R. Lozano et al.
NANOTECHNOLOGY (2010)
Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy
Terunobu Akiyama et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2010)
Dynamic behavior of the tuning fork AFM probe
Dara Bayat et al.
MICROELECTRONIC ENGINEERING (2008)
Cantilever spring constant calibration using laser Doppler vibrometry
Benjamin Ohler
REVIEW OF SCIENTIFIC INSTRUMENTS (2007)
Symmetrically arranged quartz tuning fork with soft cantilever for intermittent contact mode atomic force microscopy
T Akiyama et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2003)
Share Paper
