Journal
JOURNAL OF PHYSICAL CHEMISTRY LETTERS
Volume 13, Issue 24, Pages 5677-5682Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.jpclett.2c00605
Keywords
-
Categories
Funding
- National Natural Science Foundation of China [21902179, 21991152, 21802096]
- NSFC [11227902]
- Shanghai Sailing Program [19YF1455600]
Ask authors/readers for more resources
Ambient-pressure X-ray photoelectron spectroscopy (APXPS) was used to study the surface behavior of Pt-based catalysts under different oxygen pressures. The results show that the observed X-ray-induced oxidation phenomena are highly dependent on pressure and surface orientation, which is critical for interpreting the in situ X-ray experiments.
Ambient-pressure X-ray photoelectron spectroscopy (APXPS) is commonly used to identify active phases of Pt-based catalysts. Unavoidable beam-induced chemistry under in situ conditions with high-flux X-rays is important yet has often been disregarded. To evaluate beam effects on Pt oxidation, we revisited surface species on Pt(111) and Pt(110) in O-2 environments using APXPS. The observed X-ray-induced phenomena strongly depended on pressure and surface orientation. Below 1 mbar of O-2, we found only chemisorbed oxygen species on both surfaces. No significant change in Pt(111) was observed with long-time illumination under <= 2 mbar of O-2. Under similar to 5 mbar with similar oxygen exposure, beam-induced oxidation was apparent on Pt(111) with the formation of abundant surface oxide and chemisorbed oxygen. However, such beam-induced oxidation was strongly suppressed on Pt(110). Understanding these pressure gap and surface orientation-dependent beam-induced phenomena is essential for our interpretation of the in situ X-ray results, particularly for higher-pressure experiments with brighter synchrotron sources.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available