4.3 Article

Direct detection of charged particles with SiPMs

Journal

JOURNAL OF INSTRUMENTATION
Volume 17, Issue 6, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.1088/1748-0221/17/06/P06007

Keywords

Particle tracking detectors (Solid-state detectors); Timing detectors; Photon detectors for UV, visible and IR photons (solid-state) (PIN diodes, APDs, Si-PMTs, G-APDs, CCDs, EBCCDs, EMCCDs, CMOS imagers, etc)

Funding

  1. CERN-PS operator team

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A systematic study on the response of Silicon PhotoMultipliers to MIP charged particles was conducted for the first time, measuring time resolution and crosstalk probability using beam test data. Results indicated unexpected higher crosstalk values on different sensors compared to sensor noise levels, despite the expectation of particles traversing only one SPAD per event.
The direct response of Silicon PhotoMultipliers being traversed by a MIP charged particle have been studied in a systematic way for the first time. Using beam test data, time resolution and the crosstalk probability have been measured. A characterization of the SiPM by means of a laser beam is also reported. The results obtained for different sensors indicate a measured time resolution around 40-70 ps. Although particles are expected to traverse only one SPAD per event, crosstalk measurements on different sensors indicate an unexpected higher value with respect to the one related to the sensor noise.

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