Journal
JOURNAL OF CHEMICAL PHYSICS
Volume 157, Issue 8, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0100317
Keywords
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Funding
- Russian Foundation for Basic Research
- Ministry of Science and Technology of Taiwan [21-52-52007]
- German-Israel Foundation [GIF-I-26-303.2-2018]
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In the high-frequency limit, we found that the system's linear response cancels out completely when the pulse switches off. Surprisingly, the observables of the system can still be described using a combination of its linear density response function and nonlinear functions of the electric field. Considering the high surface sensitivity of the setup, we propose a new spectroscopic technique, which has the potential to become a powerful characterization method for nanoscience and nanotechnology.
We consider an arbitrary quantum mechanical system, initially in its ground-state, exposed to a time-dependent electromagnetic pulse with a carrier frequency omega(0) and a slowly varying envelope of finite duration. By working out a solution to the time-dependent Schrodinger equation in the high-omega(0) limit, we find that, to the leading order in omega 0-1, a perfect self-cancellation of the system's linear response occurs as the pulse switches off. Surprisingly, the system's observables are, nonetheless, describable in terms of a combination of its linear density response function and nonlinear functions of the electric field. An analysis of a jellium slab and jellium sphere models reveals a very high surface sensitivity of the considered setup, producing a richer excitation spectrum than accessible within the conventional linear response regime. On this basis, we propose a new spectroscopic technique, which we provisionally name the Nonlinear High-Frequency Pulsed Spectroscopy (NLHFPS). Combining the advantages of the extraordinary surface sensitivity, the absence of constraints by the traditional dipole selection rules, and the clarity of theoretical interpretation utilizing the linear response time-dependent density functional theory, NLHFPS has a potential to evolve into a powerful characterization method for nanoscience and nanotechnology. Published under an exclusive license by AIP Publishing.
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