4.7 Article

Modeling the temporal evolution and stability of thin evaporating films for wafer surface processing

Journal

JOURNAL OF CHEMICAL PHYSICS
Volume 157, Issue 8, Pages -

Publisher

AIP Publishing
DOI: 10.1063/5.0097409

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The interaction between thin evaporating fluid films and solids is studied using water on LiTaO3 as an example. The adsorption energies are computed and used to calculate the Gibbs free energy of water adsorption. The parameters for the disjoining pressure are obtained by fitting its integral to the computed Gibbs free energy. The temporal evolution of the water layer is described using known models for spin drying and evaporation, and the vapor above the water layer is modeled by diffusion.
The interaction of thin evaporating fluid films with solids is studied using the example of water on LiTaO3 (LTO). Adsorption energies are computed by ab initio density functional theory (DFT) and used to calculate the Gibbs free energy of adsorption of water on LTO. Integrating the disjoining pressure, consisting of molecular and structural components, with respect to film thickness gives an expression for the Gibbs free energy. In this way, parameters for the disjoining pressure can be calculated by fitting its integral to the Gibbs free energy computed by ab initio DFT. A combination of literature-known models for spin drying and evaporation is utilized to describe the temporal evolution of the water layer. The vapor above the water layer is modeled by diffusion and a mass balance is applied at the water-air interface. For thick initial layers, an analytical approximation is derived which only depends on fluid and ambient conditions but not on the substrate properties. (C) 2022 Author(s).

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