4.6 Article

Electrical and structural properties of binary Ga-Sb phase change memory alloys

Journal

JOURNAL OF APPLIED PHYSICS
Volume 132, Issue 3, Pages -

Publisher

AIP Publishing
DOI: 10.1063/5.0096022

Keywords

-

Funding

  1. Semiconductor Research Corporation [2960]
  2. SUNY-IBM AI Collaborative Research Alliance
  3. National Science Foundation [DMR 1911592]
  4. U.S. DOE Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory (BNL) [DE-SC0012704]
  5. Synchrotron Catalysis Consortium (U.S. DOE, Office of Basic Energy Sciences) [DE-SC0012335]

Ask authors/readers for more resources

This study investigates the material properties of Ga-Sb binary alloy thin films deposited under ultra-high vacuum conditions for analog phase change memory (PCM) applications. The research reveals that crystallization of this alloy occurs in a specific temperature range, with phase separation observed upon crystallization. The local structure analysis shows a decrease in bond length during the amorphous-to-crystalline phase transformation.
Material properties of Ga-Sb binary alloy thin films deposited under ultra-high vacuum conditions were studied for analog phase change memory (PCM) applications. Crystallization of this alloy was shown to occur in the temperature range of 180-264 degrees C, with activation energy >2.5 eV depending on the composition. X-ray diffraction (XRD) studies showed phase separation upon crystallization into two phases, Ga-doped A7 antimony and cubic zinc-blende GaSb. Synchrotron in situ XRD analysis revealed that crystallization into the A7 phase is accompanied by Ga out-diffusion from the grains. X-ray absorption fine structure studies of the local structure of these alloys demonstrated a bond length decrease with a stable coordination number of 4 upon amorphous-to-crystalline phase transformation. Mushroom cell structures built with Ga-Sb alloys on (sic)110 nm TiN heater show a phase change material resistance switching behavior with resistance ratio >100 under electrical pulse measurements. TEM and Energy Dispersive Spectroscopy (EDS) studies of the Ga-Sb cells after similar to 100 switching cycles revealed that partial SET or intermediate resistance states are attained by the variation of the grain size of the material as well as the Ga content in the A7 phase. A mechanism for a reversible composition control is proposed for analog cell performance. These results indicate that Te-free Ga-Sb binary alloys are potential candidates for analog PCM applications. Published under an exclusive license by AIP Publishing.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available