Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 69, Issue 7, Pages 1541-1548Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2022.3157404
Keywords
Photonics; Neutrons; Single event upsets; Iron; Electron beams; Production; Particle beam measurements; Accelerator; CERN; CERN Linear Electron Accelerator for Research (CLEAR); electrons; neutrons; photons; photonuclear reactions; radiation effects to electronics (R2E); radiation testing; single-event upsets (SEUs); static random access memories (SRAMs)
Funding
- European Union's Horizon 2020 Research and Innovation Program through the Marie Sklodowska-Curie Grant [721624]
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This study investigates the radiation environment near the terahertz dump of the CERN CLEAR electron accelerator using FLUKA simulations and single-event upset measurements. The focus is on characterizing the neutron field and evaluating its suitability for radiation tests of electronics.
We study the radiation environment near the terahertz (THz) dump of the CERN Linear Electron Accelerator for Research (CLEAR) electron accelerator at CERN, using FLUktuierende KAskade in German (FLUKA) simulations and single-event upset (SEU) measurements taken with 32-Mbit Integrated Silicon Solution Inc. (ISSI) static random access memories (SRAMs). The main focus is on the characterization of the neutron field to evaluate its suitability for radiation tests of electronics in comparison with other irradiation facilities. Neutrons at CLEAR are produced via photonuclear reactions, mostly initiated by photons from the electromagnetic cascades that occur when the beam is absorbed by the dump structure. Good agreement is generally found between the measured single-event upset (SEU) rates and the expected values obtained from FLUKA simulations and the known SEU response of the ISSI SRAMs to neutrons, while one position is found to be potentially affected by photon-driven SEUs.
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