4.6 Article

Pre-diagnosis of Failure Spots in Orange AlInGaP Light-Emitting Diodes Soaked in Liquid Nitrogen Using Machine Vision and Multiple Optical, Electrical, and Material Characterizations

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 69, Issue 8, Pages 4386-4391

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2022.3185957

Keywords

Aluminumindium gallium phosphide(Al-InGaP) light-emitting diode (LED); computer vision; damages; failure spots; liquid nitrogen (LN2); pre-diagnosis

Funding

  1. Ministry of Science and Technology, Taiwan [MOST 110-2221-E-260-006-]

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This study conducted pre-diagnosis of degraded aluminum indium gallium phosphide (AlInGaP) light-emitting diodes (LEDs) soaked in liquid nitrogen (LN2), identifying multiple failure spots and analyzing the reasons for the gradual degradation of the device.
In this study, Pre-diagnosis of degraded aluminum indium gallium phosphide (AlInGaP) light-emitting diodes (LEDs) that were soaked in liquid nitrogen (LN2) was performed. To visualize the early deterioration of LED emission, a combination of material, electrical, optical, and computer-aidedmachine-vision analysis of LED failure spots on the surface was examined. Results indicate that several small failure spots, which can be identified by the MATLAB processed emission images and surface roughness variation, can be found. Furthermore, LN2 soaking induced some local damages inside the device that penetrate themultiple-quantumwell. The decrease of current and luminescence intensity also reflects the gradual degradation of the device after being soaked in LN2. This integrated analysis and Pre-diagnosis of the degraded device provided early screeningof LEDfailure spots and real-time inspection during operations.

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