4.7 Article

Para-halogenated triphenyltriazine induced surface passivation toward efficient and stable perovskite solar cells

Journal

APPLIED SURFACE SCIENCE
Volume 590, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.apsusc.2022.153051

Keywords

Perovskite solar cells; Surface passivation; TRZ-X; High efficiency; Long-term stability

Funding

  1. Lianyungang Haiyan Plan [2018-QD-019]
  2. Postgraduate Research and Practice Innovation Program in Jiangsu Province [SY202040X]
  3. National Natural Science Foundation of China [61774069, 21805106]
  4. Six Talent Peaks Project in Jiangsu Province [JNHB 114]
  5. Open-end Funds of Jiangsu Key Laboratory of Function Control Technology for Advanced Materials, Jiangsu Ocean University [jsklfctam202103]
  6. Natural Science Foundation of the Jiangsu Higher Educations Institutions of China [18KJB480002]

Ask authors/readers for more resources

Surface passivation is an effective method to improve the efficiency and stability of perovskite solar cells. In this study, the researchers introduced a compound called TRZ-X to modify the perovskite absorbers. The unique structure and properties of TRZ-X effectively reduced the defect density of the perovskite film and prevented moisture penetration, resulting in improved power conversion efficiency and long-term stability of the devices.
Surface passivation is a practical approach to improve the efficiency and stability of perovskite solar cells (PSCs). In this paper, we introduce para-halogenated triphenyltriazine (TRZ-X, X = F, Br, I) to modify the perovskite absorbers. As the core of TRZ-X, 1,3,5-Triazine has abundant C = N bonds, which can produce intermolecular interactions with uncoordinated Pb2+. The halogen atoms as peripheral unit of TRZ-X with strong electronegativity can not only generate ionic bonds with Pb(2+ )in the perovskite but also form a stable rigid plane with the TRZ group. Under the synergy effect of C = N bonds and halogen atoms, the defect density of perovskite films is effectively decreased, contributing to the power conversion efficiency (PCE) and stability of devices. Moreover, the presence of TRZ-X hydrophobic passivation layer could prevent moisture penetration, which is beneficial to long-term stability of PSCs. Due to the strong electronegativity, TRZ-F modified device presents the best PCE of 19.81% compared with that (18.32%) of control device. In addition, TRZ-F passivated and unencapsulated device retains 81% of the initial PCE after 1200 h storage under ambient condition with a relative humidity of 70%, whereas the pristine device decays to 59% of the initial PCE under the same conditions.

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