Journal
APPLIED PHYSICS LETTERS
Volume 120, Issue 23, Pages -Publisher
AIP Publishing
DOI: 10.1063/5.0093591
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Funding
- DOE ARPA-E [DE-AR0001257, DE-AR0001552]
- ATT Foundation
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This study investigates the feasibility of using hexagonal boron nitride (BN) detectors for the detection of fast neutrons. The BN detector, fabricated from a 90 μm thick BN epilayer, exhibited a detection efficiency of about 0.1% when exposed to fast neutrons ranging from 1 to 9 MeV. The measured mean free path of fast neutrons in BN was approximately 7.6 cm. These findings suggest that incorporating BN with a large thickness can enable the direct detection of thermal to fast neutrons, leveraging the ultrawide bandgap properties of BN. The identification of a single material sensitive to both thermal and fast neutrons holds significant value for the development of neutron detection technologies.
The detection of fast neutrons is regarded technically challenging because the interaction probability of fast neutron with matter is extremely low. Based on our recent development of hexagonal boron nitride (BN) semiconductor thermal neutron detectors with a record high efficiency of 59%, we report here the feasibility studies of BN detectors for detecting fast neutrons. A BN detector with a detection area of 2.1 cm(2) was fabricated from a 90 mu m thick BN epilayer. In the presence of a bare Cf-252 source emitting fast neutrons ranging from 1 to 9 MeV, the detection efficiency was estimated to be about 0.1%. The measured mean free path of fast neutron in BN is about 7.6 cm. Together with the capability of BN for thermal neutron detection, the present results indicate that by incorporating BN with a large thickness, BN neutron detectors are expected to possess the unique capability of directly detecting thermal to fast neutrons as well as outstanding features resulting from the ultrawide bandgap of BN. The identification of a single material that is sensitive to both thermal and fast neutrons is valuable for the development of novel neutron detection technologies. Published under an exclusive license by AIP Publishing.
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