4.4 Article

Opto-electro-structural properties of Ge-doped Sb65Se35 alloys

Journal

JOURNAL OF TAIBAH UNIVERSITY FOR SCIENCE
Volume 16, Issue 1, Pages 280-287

Publisher

TAYLOR & FRANCIS LTD
DOI: 10.1080/16583655.2022.2048518

Keywords

Ge-incorporated Sb65Se35; XRD; FESEM; electrical conductivity; optical reflectivity

Funding

  1. Ministry of Education
  2. Deanship of Scientific Research Najran University -Kingdom of Saudi Arabia [NU/ESCI/17/051]

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In this study, Ge-doped Sb65Se35-xGex alloys were prepared by the melt quenching method, and their microstructural and opto-electrical characteristics were investigated. The results showed that Ge-doped Sb65Se35 alloys have a small optical band gap in the visible region, making them suitable for optoelectronic data storage applications.
The microstructural, and opto-electrical characteristics of Ge-doped antimony selenide alloys with the chemical composition Sb65Se35-xGex (0 <= x <= 20) which prepared by the melt quenching method have been studied here. In all of the investigated samples, structural studies using an X-ray diffraction pattern verified the polycrystalline nature with a simple characteristic peak of Sb2Se hexagonal rhombohedral phase. FE-SEM equipped with EDS was used to explore the morphology and composition of the samples. Raman spectra show a small shift in wave number with the addition of dopant, which could be due to lattice distortion. Electrical conductivity results demonstrate that the samples are degenerate semiconductors. The Eopt of Ge-doped Sb65Se35 alloys was derived using the KM function from DR spectra, and it changed as the Ge ion concentration rises. Ge-doped Sb65Se35 alloys have an optical band gap in the visible sector, making them a potential material for optoelectronic data storage applications.

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