Journal
ALEXANDRIA ENGINEERING JOURNAL
Volume 61, Issue 6, Pages 4323-4330Publisher
ELSEVIER
DOI: 10.1016/j.aej.2021.09.050
Keywords
Elliptic optical vortices; Gradient force; Topological charge measurement; Diffraction patterns
Categories
Funding
- National Natural Science Foundation of China [11847078, 62005041, 62071088]
- National Key R&D Program of China [2018YFB0407102, 2018YFB1801302]
- Natural Science Foundation of Guangdong Province [2018A030310662]
- Project for Innovation Team of Guangdong University [2018KCXTD033]
- Project for Science and Technology of Guangdong Province [2021A0101180005]
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An efficient and simple method for measuring the topological charge and ellipticity of elliptic vortex beams is presented in this paper. The scheme works well even for high-order elliptic vortex, with a topological charge value as high as +/- 18 and an ellipticity range from 0.5 to 2. The measurement of topological charge and ellipticity has important research value for promoting the application of elliptical vortex beams.
The intensities and phase profiles of the elliptic optics vortex beam both are determined by the topological charge (TC) and ellipticity. This paper presents an efficient and simple method for measuring the TC and ellipticity of elliptic vortex. By observing the diffraction patterns, the TC modulus and ellipticity can be probed with the suitable rectangular aperture, and the TC sign can be detected with the suitable right triangular aperture. The scheme works well even for high-order elliptic vortex with topological charge value as high as +/- 18, and ellipticity range from 0.5 to 2 at least. Obviously, the measurement of TC and ellipticity have important research value for promoting the application of elliptical vortex. (C) 2021 THE AUTHORS. Published by Elsevier BV on behalf of Faculty of Engineering, Alexandria University.
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