4.6 Article

Isolation and Grading of Faults in Battery Packs Based on Machine Learning Methods

Journal

ELECTRONICS
Volume 11, Issue 9, Pages -

Publisher

MDPI
DOI: 10.3390/electronics11091494

Keywords

battery fault diagnosis; recursive correlation coefficient; artificial neural network; relevance vector machine

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An intelligent fault diagnosis scheme for series-connected battery packs based on wavelet characteristics of battery voltage correlations is proposed in this work, which can effectively detect and locate different faults with high success rates of feature extraction and accurate classification. In thermal fault diagnosis, mRVM outperforms ANN, but the overall diagnostic performance of ANN is better.
As the installed energy storage stations increase year by year, the safety of energy storage batteries has attracted the attention of industry and academia. In this work, an intelligent fault diagnosis scheme for series-connected battery packs based on wavelet characteristics of battery voltage correlations is designed. First, the cross-cell voltages of multiple cells are preprocessed using an improved recursive Pearson correlation coefficient to capture the abnormal electrical signals. Secondly, the wavelet packet decomposition is applied to the coefficient series to obtain fault-related features from wavelet sub-bands, and the most representative characteristic principal components are extracted. Finally, the artificial neural network (ANN) and multi-classification relevance vector machine (mRVM) are employed to classify and evaluate fault mode and fault degree, respectively. Physical injection of external and internal short circuits, thermal damage, and loose connection failure is carried out to collect real fault data for model training and method validation. Experimental results show that the proposed method can effectively detect and locate different faults using the extracted fault features; mRVM is better than ANN in thermal fault diagnosis, while the overall diagnosis performance of ANN is better than mRVM. The success rates of fault isolation are 82% and 81%, and the success rates of fault grading are 98% and 90%, by ANN and mRVM, respectively.

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