Linear retardance and diattenuation dispersion measurements of anisotropic medium with Jones calculus based spectrometric technique

A white light spectrometric technique based on the Jones Calculus (JC) formalism using channelled transmission spectra has been developed to measure the linear retardance (LR) and diattenuation (LD) of a Mylar film, widely used for liquid crystal display devices. The sample was placed between two identical polarizers and the channelled spectra of two different configurations (parallel and crossed) were recorded. Transmitted light intensity data over a broad visible spectral range of both channelled spectra were then combined in order to derive the dispersion of retardance and diattenuation of the Mylar film with respect to the wavelength. This technique is fast, easy to setup, and straightforward; and the proposed model, based on the Jones formalism, offers an intuitive and simple calculation, particularly because, unlike other models based on the Mueller calculus, Jones matrices have simpler properties and are more easily manipulated and interpreted. Moreover, the technique provides a complete analytical formulation of transmitted light intensity taking into account the diattenuation defect in both polarizers and sample.

Automated summary

A white light spectrometric technique based on the Jones Calculus has been developed to measure the linear retardance and diattenuation of a Mylar film. The technique is fast, easy to setup, and provides a intuitive and simple calculation based on the Jones formalism.