Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the increment and psi ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such polymer opals in large scale processing and applications.

Automated summary

The method of spectroscopic ellipsometry is used to investigate complex periodic nanomaterials with intense resonant structural color. A multilayer optical quasi-model is developed to understand the correlation between ellipsometric parameters and shear-induced crystallinity. These approaches provide reliable means for in-line tracking of sample quality in large scale processing and applications of such materials.