4.8 Article

Analytical and experimental investigation of dual-mode piezo-gated thin film transistor for force sensors

Journal

NANO ENERGY
Volume 95, Issue -, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.nanoen.2022.106985

Keywords

Piezo-gated thin film transistor; ZnO; Dual-mode; Gauge factor; Force sensor

Funding

  1. Ministry of Science and Technology of Taiwan [MOST 109-266-F-006-039, MOST 110-2823-8-006-002, MOST 110-2221-E-006-116-MY3, MOST 110-2221-E-006-117-MY3, MOST 109-2622-8-006-005, MOST 110-2634-F-006-017]

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This study proposes a full-functional piezo-gated thin film transistor (PGTFT) using ZnO thin film as a model material to detect strain in dual modes. Through analytical and experimental approaches, the study demonstrates the carrier concentration-dependent behavior of the PGTFT. The high-quality and performance of the PGTFT are validated through morphological, structural, and electrical analysis.
Piezo-gated thin film transistor (PGTFT) capable of modulating charge transport solely relying on piezo-gating effect plays a pivotal role in developing advanced piezotronic devices. However, most previous PGTFTs were reported to show indistinct piezo-gating effect through piezoelectric-induced modulation of Schottky barrier height in detecting only one-dimensional strain for force sensors. Therefore, we first propose a full-functional PGTFT using ZnO thin film as model piezoelectric semiconducting material that works on dual-mode as depletion and accumulation of charges in detecting strain by both analytically and experimentally to exhibit carrier concentration-dependent behavior. Prior to the PGTFT fabrication, the carrier concentrations of the RF-sputtered ZnO thin films are intentionally varied by varying atmosphere conditions. All the ZnO thin films are fully analyzed regarding morphology, structure and electrical properties to validate the high-quality c-axis oriented with Zn+ terminated crystalline thin films. Finally, two configurations of the PGTFTs are completed with top and bottom electrodes. The I-V curves of the PGTFTs subjected to external forces exhibit opposite force dependence between the top-electrode and bottom-electrode PGTFTs, in agreement with the simulated data. Further, the effect of free carrier concentration on the depletion and accumulation mode through piezo-gating effect is investigated, where an enhancement of around 44.6% in gauge factor is achieved for an order of reduction in the carrier concentration. We provide new insights into the piezo-gating effect by the novel ohmic-contact-based PGTFT, which can be operated in dual mode for acquiring more information as the basis of a multidimensional piezotronic force sensor.

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