Electro-optic characterization of synthesized infrared-visible light fields

A continuum spanning from 300 and 3000 nm is used to synthesize a single-cycle field transient and measure its waveform through electro-optic sampling, speeding up this sensitive technique so that it can access the electric field of visible light. The measurement and control of light field oscillations enable the study of ultrafast phenomena on sub-cycle time scales. Electro-optic sampling (EOS) is a powerful field characterization approach, in terms of both sensitivity and dynamic range, but it has not reached beyond infrared frequencies. Here, we show the synthesis of a sub-cycle infrared-visible pulse and subsequent complete electric field characterization using EOS. The sampled bandwidth spans from 700 nm to 2700 nm (428 to 110 THz). Tailored electric-field waveforms are generated with a two-channel field synthesizer in the infrared-visible range, with a full-width at half-maximum duration as short as 3.8 fs at a central wavelength of 1.7 mu m (176 THz). EOS detection of the complete bandwidth of these waveforms extends it into the visible spectral range. To demonstrate the power of our approach, we use the sub-cycle transients to inject carriers in a thin quartz sample for nonlinear photoconductive field sampling with sub-femtosecond resolution.

Automated summary

This study synthesizes a single-cycle field transient using a continuum spanning from 300 to 3000 nm and measures its waveform through electro-optic sampling. The technique enables the measurement of the electric field of visible light, allowing the study of ultrafast phenomena. The complete electric field characterization using electro-optic sampling expands the detection range beyond infrared frequencies.