Journal
JOURNAL OF APPLIED PHYSICS
Volume 119, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4940159
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Funding
- KAKENHI from the Japan Society for the Promotion of Science (JSPS) [26610081, 26390075, 15H03968, 14F04907]
- Photon Frontier Network Program of MEXT
- JST-SENTAN
- JST-CREST in Japan
- Grants-in-Aid for Scientific Research [26390075, 15H03968, 14F04907] Funding Source: KAKEN
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In this work, we propose and demonstrate a durable and distributable Lambertian light-emitter secondary standard using the electroluminescence (EL) of a Si solar cell. This standard is useful for calibration of the absolute sensitivity of an EL-imaging infrared camera used to acquire quick on-site measurements of the absolute EL efficiencies of individual Si solar cells in modules and arrays. The developed method enables the realization of quantitative open-circuit voltage mapping. (c) 2016 AIP Publishing LLC.
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