Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 515, Issue -, Pages 14-19Publisher
ELSEVIER
DOI: 10.1016/j.nimb.2022.01.006
Keywords
Low energy AMS; Al-26; AMS sample material; AMS interference
Categories
Funding
- National Natural Science Founda-tions of China [11775157]
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Experimental studies were conducted on using AlN as a potential target material to replace Al2O3, and it was found that the Mg element is still one of the main interference factors for low-energy Al-26-AMS.
The Aluminum-26 accelerator mass spectrometry (AMS) technique has been widely applied in many scientific fields. At present, Al2O3 is routinely used as the target material for A(l-) extractions. However, the lower Al- ion beam current limits the measurement sensitivity. In this study, a series of experiments on Al- ion beam current, conductive agent, and interference background were carried out based on previous research and the low-energy AMS system of Tianjin University. The results showed that AlN as a potential target material to replace Al2O3 is worth further study, while Mg element is still one of the main interference factors for low-energy Al-26-AMS.
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