4.6 Article

Study of Size, Shape, and Etch pit formation in InAs/InP Droplet Epitaxy Quantum Dots

Journal

NANOTECHNOLOGY
Volume 33, Issue 30, Pages -

Publisher

IOP Publishing Ltd
DOI: 10.1088/1361-6528/ac659e

Keywords

quantum dots; X-STM; droplet epitaxy; morphology; InAs etch pits

Funding

  1. European Union [721 394]

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We investigated the structural characteristics of InAs/InP quantum dots grown by metal-organic vapor phase epitaxy using droplet epitaxy (DE) and Stranski-Krastanov (SK) methods. Our atomic-scale comparison revealed that DE produces more uniform and shape-symmetric quantum dots. We also observed localized etch pits for the first time in InAs/InP DE quantum dots and discussed the etching mechanism. This study provides valuable feedback for optimizing quantum dot growth for applications in quantum technology.
We investigated metal-organic vapor phase epitaxy grown droplet epitaxy (DE) and Stranski-Krastanov (SK) InAs/InP quantum dots (QDs) by cross-sectional scanning tunneling microscopy (X-STM). We present an atomic-scale comparison of structural characteristics of QDs grown by both growth methods proving that the DE yields more uniform and shape-symmetric QDs. Both DE and SKQDs are found to be truncated pyramid-shaped with a large and sharp top facet. We report the formation of localized etch pits for the first time in InAs/InP DEQDs with atomic resolution. We discuss the droplet etching mechanism in detail to understand the formation of etch pits underneath the DEQDs. A summary of the effect of etch pit size and position on fine structure splitting (FSS) is provided via the k center dot p theory. Finite element (FE) simulations are performed to fit the experimental outward relaxation and lattice constant profiles of the cleaved QDs. The composition of QDs is estimated to be pure InAs obtained by combining both FE simulations and X-STM results. The preferential formation of {136} and {122} side facets was observed for the DEQDs. The formation of a DE wetting layer from As-P surface exchange is compared with the standard SKQDs wetting layer. The detailed structural characterization performed in this work provides valuable feedback for further growth optimization to obtain QDs with even lower FSS for applications in quantum technology.

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