Effects of Ag content on the interfacial reactions between liquid Sn-Ag-Cu solders and Cu substrates during soldering

The effects of Ag content on the interfacial reactions between Sn-Ag-Cu (SAC) solders and Cu substrates during soldering were studied based on an experiment in which the liquid solder is removed after a long exposure time. This removal of the solder allows for the capture and visualization of the interfacial IMCs formed during soldering and avoids the influence of Cu6Sn5 precipitated from the solder matrix during cooling. The results showed that a Cu6Sn5 scallop type layer with round grains having a strong texture was formed at the interface of the SAC solders/Cu systems. The addition of Ag decreased the IMC/liquid SAC solder interfacial energy and improved the wettability of the solder on the Cu. In addition to the reaction energy, the interfacial microstructure also affected the interfacial IMC growth extent. By changing the growth environment near the interface, Ag affected the orientation of Cu6Sn5 grains formed at the interface, leading to the evolution of a microstructure that generates more Cu6Sn5 grain boundaries at the interface. Consequently, under the same reflow conditions, SAC solders with a higher Ag content in contact with the Cu substrate form thicker IMCs interfacial layers. (C) 2016 Elsevier B.V. All rights reserved.