Journal
INORGANIC CHEMISTRY COMMUNICATIONS
Volume 139, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.inoche.2022.109356
Keywords
Graphene oxide; EDAX; FT-IR; Thin film; XPS; Raman
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Funding
- UGC [F.PSW-140/15-16]
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This study successfully synthesized graphene oxide (GO) sheets with a bi-directional lamellar layer structure and analyzed and validated them through various instrumental characterizations. The morphology of GO thin film was also described in this experimental study.
Graphene oxide (GO) sheets possess a 2D filiform structure and were indigenously synthesized via the enhanced Hummer methodology. It is accepted that the redox approach may be a distinctive technique to fabricate GO films as a sheet on an expanded scale. Instrumental characterizations showed that GO sheets ready during this study had a bi-directional lamellar layer structure and a thickness of 3-5 nm. FT-IR study was carried out to validate due to the incidence of oxygen functional groups in GO films. The Raman spectra of GO sheets have been simulated to get stable structure, functional groups. EDAX microanalysis, Elemental analyzer (EA), and X-ray photoelectron spectroscope (XPS) analyzed the elements of artificial substances. Moreover, the morphology of GO thin film was delineated during this experimental study.
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