4.7 Article

Joint Prediction for Future Failures Times Under Type-II Censoring

Journal

IEEE TRANSACTIONS ON RELIABILITY
Volume 71, Issue 1, Pages 100-110

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TR.2021.3068080

Keywords

Exponential distribution; Optimized production technology; Optimization; Bayes methods; Random variables; Monte Carlo methods; Terminology; Constrained optimization; exponential distribution; pivotal quantity; prediction region; type -II censoring

Funding

  1. Ministry of Science and Innovation (MICINN) of Spain [PID2019-110442GB-I00]

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This study investigates the construction of prediction sets for future failure times based on a type-II censored sample from the exponential distribution. Balanced prediction sets and a constrained optimization problem are used to determine the prediction region with minimal area. Monte Carlo simulation and real data examples are provided to compare the performance and illustrate the methods, with discussions on applications and extensions of the results.
The construction of prediction sets (or regions) for future failure times based on a type-II censored sample from the exponential distribution is investigated. Based on the distribution of the sum of independent exponential variables with different parameters, we obtain the distribution of the required pivotal quantities in order to find the prediction regions. Balanced prediction sets are first derived. A constrained optimization problem is then formulated and solved to determine the prediction region with minimal area. A Monte Carlo simulation study is carried out to compare the performance of the proposed prediction sets. Two real data examples are provided and analyzed to illustrate the methods presented. Finally, some applications and extensions of the results are discussed.

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