Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 69, Issue 3, Pages 485-490Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2021.3123814
Keywords
Protons; Silicon; Detectors; Radiation effects; Energy measurement; Dosimetry; Calibration; Low-energy protons; silicon detector; single event effects (SEEs)
Funding
- European Union's Horizon 2020 Research and Innovation Programme through the Marie Sklodowska Curie Grant [721624]
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A silicon detector with fast electronics is used for dosimetry of protons in the range of 0.5-5 MeV at CNA laboratory in Seville, Spain. Measurements in pulsed mode using a digitizer to record proton energy depositions enable single event effect testing on selected SRAMs.
A silicon detector with a fast electronics chain is used for the dosimetry of protons in the range 0.5-5 MeV at the Centro Nacional de Aceleradores (CNA) 3 MV Tandem laboratory in Seville, Spain. In this configuration, measurements can be performed in pulsed mode, using a digitizer to record event-by-event proton energy depositions. The distributions of deposited energy were obtained thanks to a calibration with an alpha source. Measurements of flux and deposited energy are used to enable single event effect (SEE) testing on selected static random access memories (SRAMs).
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