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JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 55, Issue 5, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.7567/JJAP.55.05FC01
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In this paper, we discusse the origin of basal-plane stacking faults (BSFs) generated in the homoepitaxial hydride vapor phase epitaxy (HVPE) growth of m-plane gallium nitride (GaN). We investigated the effects of seed quality, especially dislocation density, on BSF generation during homoepitaxy. The results clearly identify basal-plane dislocation in the seed as a cause of BSF generation. We realized high-quality m-plane GaN substrates with a 2-in. diameter using HVPE on low-dislocation-density m-plane seeds. (C) 2016 The Japan Society of Applied Physics
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