4.8 Article

Sulfonic Zwitterion for Passivating Deep and Shallow Level Defects in Perovskite Light-Emitting Diodes

Journal

ADVANCED FUNCTIONAL MATERIALS
Volume 32, Issue 22, Pages -

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.202111578

Keywords

defect; light emitting diodes; passivation; perovskite; zwitterion

Funding

  1. National Natural Science Foundation of China [61961160733, 61875084, 61922041, 22179061, 62105266, 61935017, 62134007]
  2. National Science Fund for Distinguished Young Scholars [61725502]
  3. Major Program of Natural Science Research of Jiangsu Higher Education Institutions of China [19KJA520004]
  4. Joint Research Funds of the Department of Science & Technology of Shaanxi Province and NPU [2020GXLH-Z-024]

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In this study, perovskite composite films for high performance PeLEDs were developed using zwitterion 3-aminopropanesulfonic acid (APS) as an additive. The sulfonic group of APS can passivate deep and shallow level defects in perovskites via coordinate and hydrogen bonding, leading to improved stability and efficiency of the perovskite composite films.
Chemical passivation via functional additives plays a critical role in achieving high performance perovskite light-emitting diodes (PeLEDs). Here, perovskite composite films for high performance PeLEDs by using zwitterion 3-aminopropanesulfonic acid (APS) as the additive are developed. The sulfonic group of APS can simultaneously passivate deep and shallow level defects in perovskites via coordinate and hydrogen bonding, which leads to suppressed non-radiative recombination and ion migration in the perovskite composite films. Based on this, PeLEDs with a peak external quantum efficiency of 19.2% and a half-lifetime of 43 h at a constant current density of 100 mA cm(-2) are obtained, representing one of the most stable and efficient PeLEDs under high current densities.

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