Journal
ACS NANO
Volume 16, Issue 4, Pages 6206-6214Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsnano.2c00012
Keywords
oxygen vacancy channel; ionic liquid gating; strontium cobaltite; brownmillerite; strain
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Funding
- European Union's Horizon 2020 research and innovation programm [737109]
- Alexander von Humboldt Foundation
- AEI/FEDER [PID2020-116181RB-C32, PCI2019-111908-2]
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Oxygen defects and their atomic arrangements play a significant role in the physical properties of transition metal oxides. This study demonstrates a method to electrically control the ordering of oxygen vacancy channels using ionic liquid gating, providing a new approach for the fabrication of oxitronic devices.
Oxygen defects and their atomic arrangements play a significant role in the physical properties of many transition metal oxides. The exemplary perovskite SrCoO3-delta (P-SCO) is metallic and ferromagnetic. However, its daughter phase, the brownmillerite SrCoO2.5 (BM-SCO), is insulating and an antiferromagnet. Moreover, BM-SCO exhibits oxygen vacancy channels (OVCs) that in thin films can be oriented either horizontally (H-SCO) or vertically (V-SCO) to the film's surface. To date, the orientation of these OVCs has been manipulated by control of the thin film deposition parameters or by using a substrate-induced strain. Here, we present a method to electrically control the OVC ordering in thin layers via ionic liquid gating (ILG). We show that H-SCO (antiferromagnetic insulator, AFI) can be converted to P-SCO (ferromagnetic metal, FM) and subsequently to V-SCO (AFI) by the insertion and subtraction of oxygen throughout thick films via ILG. Moreover, these processes are independent of substrate-induced strain which favors formation of H-SCO in the as-deposited film. The electric-field control of the OVC channels is a path toward the creation of oxitronic devices.
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