Related references
Note: Only part of the references are listed.Degradation Mechanism of Silver Metal Deposited on Lead Halide Perovskites
Sebastian Svanstrom et al.
ACS APPLIED MATERIALS & INTERFACES (2020)
Investigating the Effects of Chemical Gradients on Performance and Reliability within Perovskite Solar Cells with TOF-SIMS
Steven P. Harvey et al.
ADVANCED ENERGY MATERIALS (2020)
Validated Analysis of Component Distribution Inside Perovskite Solar Cells and Its Utility in Unveiling Factors of Device Performance and Degradation
Cheng-Hung Hou et al.
ACS APPLIED MATERIALS & INTERFACES (2020)
Damage and repair of organic and inorganic surfaces by Ar+ ion and gas cluster ion beam sputtering
David F. Yancey et al.
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA (2019)
Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams
Celine Noel et al.
MATERIALS (2019)
Mitigating Measurement Artifacts in TOF-SIMS Analysis of Perovskite Solar Cells
Steven P. Harvey et al.
ACS APPLIED MATERIALS & INTERFACES (2019)
Emerging Organic and Organic/Inorganic Hybrid Photovoltaic Devices for Specialty Applications: Low-Level-Lighting Energy Conversion and Biomedical Treatment
Fang-Chung Chen
ADVANCED OPTICAL MATERIALS (2019)
Effect of energy per atom (E/n) on the Ar gas cluster ion beam (Ar-GCIB) and O2+ cosputter process
Shin-Kung Wang et al.
ANALYST (2019)
Formation and Diffusion of Metal Impurities in Perovskite Solar Cell Material CH3NH3PbI3: Implications on Solar Cell Degradation and Choice of Electrode
Wenmei Ming et al.
ADVANCED SCIENCE (2018)
Probing Perovskite Inhomogeneity beyond the Surface: TOF-SIMS Analysis of Halide Perovskite Photovoltaic Devices
Steven P. Harvey et al.
ACS APPLIED MATERIALS & INTERFACES (2018)
Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry
Nicholas Winograd
ANNUAL REVIEW OF ANALYTICAL CHEMISTRY, VOL 11 (2018)
Dual mode OPV-OLED device with photovoltaic and light-emitting functionalities
Takayuki Chiba et al.
SCIENTIFIC REPORTS (2018)
Catalytic metal-induced crystallization of sol-gel metal oxides for high-efficiency flexible perovskite solar cells
Cheng-Hung Hou et al.
JOURNAL OF MATERIALS CHEMISTRY A (2018)
Accurate and reproducible in-depth observation of organic-inorganic hybrid materials using FIB-TOF-SIMS
Shin-Ichi Iida et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B (2018)
XPS Depth profiles of organo lead halide layers and full perovskite solar cells by variable-size argon clusters
Yan Busby et al.
PHYSICAL CHEMISTRY OF SEMICONDUCTOR MATERIALS AND INTERFACES XVII (2018)
3D In Situ ToF-SIMS Imaging of Perovskite Films under Controlled Humidity Environmental Conditions
Wei-Chun Lin et al.
ADVANCED MATERIALS INTERFACES (2017)
New horizons in sputter depth profiling inorganics with giant gas cluster sources: Niobium oxide thin films
Ashley A. Ellsworth et al.
SURFACE AND INTERFACE ANALYSIS (2017)
XPS investigation of monatomic and cluster argon ion sputtering of tantalum pentoxide
Robin Simpson et al.
APPLIED SURFACE SCIENCE (2017)
Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+-Ar+ cosputtering
Hua-Yang Liao et al.
ANALYTICA CHIMICA ACTA (2014)
Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry
Peter J. Cumpson et al.
JOURNAL OF APPLIED PHYSICS (2013)
Universal Equation for Argon Gas Cluster Sputtering Yields
M. P. Seah
JOURNAL OF PHYSICAL CHEMISTRY C (2013)
ToF-SIMS depth profiling of organic solar cell layers using an Ar cluster ion source
Vincent S. Smentkowski et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A (2013)
Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications
Peter J. Cumpson et al.
SURFACE AND INTERFACE ANALYSIS (2013)
Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams
Li Yang et al.
JOURNAL OF PHYSICAL CHEMISTRY C (2012)
X-ray photoelectron spectroscopy study of polyimide thin films with Ar cluster ion depth profiling
T. Miyayama et al.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A (2010)
Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams
Takuya Miyayama et al.
SURFACE AND INTERFACE ANALYSIS (2010)
Sputter-induced chemical transformation in oxoanions by combination of C-60(+) and Ar+ ion beams analyzed with X-ray photoelectron spectrometry
Yu-Chin Lin et al.
ANALYST (2009)
Sputtering yields of Ru, Mo, and Si under low energy Ar+ bombardment
Shiou-Min Wu et al.
JOURNAL OF APPLIED PHYSICS (2009)
Gas cluster ion beam equipment and applications for surface processing
Noriaki Toyoda et al.
IEEE TRANSACTIONS ON PLASMA SCIENCE (2008)
Cluster size dependence of sputtering yield by cluster ion beam irradiation
T Seki et al.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS (2006)