Related references
Note: Only part of the references are listed.Micro-photoluminescence studies of shallow boron diffusions below polysilicon passivating contacts
Huiting Wu et al.
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2021)
Onset of ring defects in n-type Czochralski-grown silicon wafers
Rabin Basnet et al.
JOURNAL OF APPLIED PHYSICS (2020)
Detailed analysis of radiative transitions from defects in n-type monocrystalline silicon using temperature- and light intensity-dependent spectral Photoluminescence
Robert (Rob) Lee Chin et al.
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2020)
Defect luminescence from thermal donors in silicon: impact of dopant type and thermal donor concentration
Manjula Siriwardhana et al.
2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) (2020)
Impact of iron on the room temperature luminescence efficiency of oxygen-containing precipitates in silicon
Karsten Bothe et al.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY (2019)
Effects of Iron Contamination and Hydrogen Passivation on the Electrical Properties of Oxygen Precipitates in CZ-Si
Jiyang Li et al.
JOURNAL OF ELECTRONIC MATERIALS (2018)
Methods to Improve Bulk Lifetime in n-Type Czochralski-Grown Upgraded Metallurgical-Grade Silicon Wafers
Rabin Basnet et al.
IEEE JOURNAL OF PHOTOVOLTAICS (2018)
Ring defects in n-type Czochralski-grown silicon: A high spatial resolution study using Fourier-transform infrared spectroscopy, micro-photoluminescence, and micro-Raman
Rabin Basnet et al.
JOURNAL OF APPLIED PHYSICS (2018)
Growth of Oxygen Precipitates and Dislocations in Czochralski Silicon
Fiacre E. Rougieux et al.
IEEE JOURNAL OF PHOTOVOLTAICS (2017)
Microscopic Distributions of Defect Luminescence From Subgrain Boundaries in Multicrystalline Silicon Wafers
Hieu T. Nguyen et al.
IEEE JOURNAL OF PHOTOVOLTAICS (2017)
On the nature of striations in n-type silicon solar cells
Alessia Le Donne et al.
APPLIED PHYSICS LETTERS (2016)
Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging
Jonas Schoen et al.
JOURNAL OF APPLIED PHYSICS (2016)
Investigation of hydrogenation in n-type wafers with ring- and disc-shaped defect zones
Petra Manshanden et al.
PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS (SILICONPV 2016) (2016)
Dislocations in laser-doped silicon detected by micro-photoluminescence spectroscopy
Hieu T. Nguyen et al.
APPLIED PHYSICS LETTERS (2015)
The effect of oxide precipitates on minority carrier lifetime in n-type silicon
J. D. Murphy et al.
JOURNAL OF APPLIED PHYSICS (2015)
Hydrogen passivation of defect-rich n-type Czochralski silicon and oxygen precipitates
Brett Hallam et al.
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2015)
Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon
Carsten Schinke et al.
AIP ADVANCES (2015)
Micrometer-Scale Deep-Level Spectral Photoluminescence From Dislocations in Multicrystalline Silicon
Hieu T. Nguyen et al.
IEEE JOURNAL OF PHOTOVOLTAICS (2015)
Effects of solar cell processing steps on dislocation luminescence in multicrystalline silicon
Hieu T. Nguyen et al.
5TH INTERNATIONAL CONFERENCE ON SILICON PHOTOVOLTAICS, SILICONPV 2015 (2015)
Polarized photoluminescence imaging analysis around small-angle grain boundaries in multicrystalline silicon wafers for solar cells
Gen Kato et al.
JAPANESE JOURNAL OF APPLIED PHYSICS (2014)
Removing the effect of striations in n-type silicon solar cells
G. Coletti et al.
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2014)
Photoluminescence and infrared spectroscopy for the study of defects in silicon for photovoltaic applications
Simona Binetti et al.
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2014)
Spectroscopy and Topography of Deep-Level Luminescence in Photovoltaic Silicon
Michio Tajima
IEEE JOURNAL OF PHOTOVOLTAICS (2014)
On the mechanism of recombination at oxide precipitates in silicon
J. D. Murphy et al.
APPLIED PHYSICS LETTERS (2013)
Impact of phosphorus gettering parameters and initial iron level on silicon solar cell properties
Ville Vahanissi et al.
PROGRESS IN PHOTOVOLTAICS (2013)
Room temperature sub-bandgap photoluminescence from silicon containing oxide precipitates
K. Bothe et al.
APPLIED PHYSICS LETTERS (2012)
Spin-dependent recombination in Czochralski silicon containing oxide precipitates
V. Lang et al.
JOURNAL OF APPLIED PHYSICS (2012)
Deep-level photoluminescence due to dislocations and oxygen precipitates in multicrystalline Si
Michio Tajima et al.
JOURNAL OF APPLIED PHYSICS (2012)
Polarisation analysis of luminescence for the characterisation of defects in silicon wafer solar cells
Matthew P. Peloso et al.
PROGRESS IN PHOTOVOLTAICS (2012)
Polarization analysis of luminescence for the characterization of silicon wafer solar cells
Matthew P. Peloso et al.
APPLIED PHYSICS LETTERS (2011)
Direct comparison of boron, phosphorus, and aluminum gettering of iron in crystalline silicon
S. P. Phang et al.
JOURNAL OF APPLIED PHYSICS (2011)
Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging
Jonas Haunschild et al.
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS (2011)
Self-consistent optical parameters of intrinsic silicon at 300 K including temperature coefficients
Martin A. Green
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2008)
Photoluminescence imaging of silicon wafers
T. Trupke et al.
APPLIED PHYSICS LETTERS (2006)
The origin of photoluminescence from oxygen precipitates nucleated at low temperature in semiconductor silicon
E Leoni et al.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY (2004)
Optical properties of oxygen precipitates and dislocations in silicon
S Binetti et al.
JOURNAL OF APPLIED PHYSICS (2002)
Room-temperature luminescence and electron-beam-induced current (EBIC) recombination behaviour of crystal defects in multicrystalline silicon
M Kittler et al.
SOLAR ENERGY MATERIALS AND SOLAR CELLS (2002)
Mechanisms of transition-metal gettering in silicon
SM Myers et al.
JOURNAL OF APPLIED PHYSICS (2000)
Electron spin resonance centers associated with oxygen precipitates in Czochralski silicon crystals
M Koizuka et al.
JOURNAL OF APPLIED PHYSICS (2000)
Defect monitoring using scanning photoluminescence spectroscopy in multicrystalline silicon wafers
S Ostapenko et al.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY (2000)