Probing single crystal orientation by X-ray diffraction for nickel-based superalloys

The deviation angles of Ni-based single crystal superalloys are investigated by two techniques of rotating orientation X-ray diffraction (RO-XRD) and back-reflection Laue X-ray diffraction (BRL-XRD). The remarkable agreement between the RO-XRD and BRL-XRD methods provides strong evidence that the cutting direction has a significant effect on the deviation angle. Regardless of the deviation angle, the primary orientation angle is presented to characterize the inherent orientation changes in Ni-based single crystal superalloy, and it eliminates the effects of cutting direction. Furthermore, two pairs of diffraction peaks of the RO-XRD pattern could be developed in Ni-based single crystal superalloy, although these peaks are generally considered to take place in a bicrystal.

Automated summary

By investigating the deviation angles of Ni-based single crystal superalloys using both RO-XRD and BRL-XRD techniques, it was found that the cutting direction significantly affects the deviation angle. The primary orientation angle is used to characterize inherent orientation changes and eliminate the effects of cutting direction in Ni-based single crystal superalloys. Additionally, two pairs of diffraction peaks can be observed in the RO-XRD pattern of Ni-based single crystal superalloys.