Journal
APPLIED SCIENCES-BASEL
Volume 11, Issue 22, Pages -Publisher
MDPI
DOI: 10.3390/app112210507
Keywords
atomic force microscopy; magnetic force microscopy; multifrequency; nanoscale; nano-magnetism
Categories
Funding
- Spanish Ministry of Science and Innovation [MAT2016-76824-C3-1-R, PID2019-108075RB-C31, AEI/10.13039/501100011033]
- Maria de Maeztu Program for Units of Excellence in RD [MDM2014-0377]
- Regional Government of Madrid [S2018/NMT-4321 NANOMAGCOST-CM, SI1/PJI/2019-00055]
- Autonomous University of Madrid: Excelencia para el Profesorado Universitario
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Magnetic Force Microscopy (MFM) is a key technique for studying low-dimensional magnetic materials, traditionally used for samples in data storage. Advances in MFM modes have expanded its applications to skyrmionic structures, 2D materials, and biological samples, but caution is needed to account for potential artifacts in magnetic images.
Magnetic Force Microscopy (MFM) is the principal characterization technique for the study of low-dimensional magnetic materials. Nonetheless, during years, the samples under study was limited to samples in the field of data storage, such as longitudinal hard disk, thin films, or patterned nanostructures. Nowadays, thanks to the advances and developments in the MFM modes and instrumentation, other fields are emerging like skyrmionic structures, 2D materials or biological samples. However, in these experiments artifacts in the magnetic images can have strong impact and need to be carefully verified for a correct interpretation of the results. For that reason, in this paper we will explore new ideas combining the multifrequency modes with the information obtained from the experimental dissipation of energy associated to tip-sample interactions.
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