Scanning X-Ray Diffraction Microscopy for Diamond Quantum Sensing

An understanding of nano- and microscale crystal strain in chemical-vapor-deposition diamond is crucial to the advancement of diamond quantum technologies. In particular, the presence of such strain and its characterization presents a challenge to diamond-based quantum sensing and information applications-as well as for future dark-matter detectors, where the directional information about incoming particles is encoded in crystal strain. Here, we exploit nanofocused scanning x-ray diffraction microscopy to quantitatively measure crystal deformation from defects in diamond with high spatial and strain resolution. The combination of information from multiple Bragg angles allows stereoscopic three-dimensional modeling of strain-feature geometry; the diffraction results are validated via comparison to optical measurements of the strain tensor based on spin-state-dependent spectroscopy of ensembles of nitrogen-vacancy centers in the diamond. Our results demonstrate both strain and spatial resolution sufficient for directional detection of dark matter via x-ray measurement of crystal strain and provide a promising tool for diamond growth analysis and improvement of defect-based sensing.

Automated summary

Understanding nano- and microscale crystal strain in chemical-vapor-deposition diamond is crucial for diamond quantum technologies. Quantitative measurement of crystal deformation in diamond with high spatial and strain resolution is achieved using nanofocused scanning x-ray diffraction microscopy, allowing for stereoscopic three-dimensional modeling of strain-feature geometry. These results provide both strain and spatial resolution sufficient for directional detection of dark matter and offer a promising tool for diamond growth analysis and improvement of defect-based sensing.