4.6 Article

Micromirror Total Internal Reflection Microscopy for High-Performance Single Particle Tracking at Interfaces

Journal

ACS PHOTONICS
Volume 8, Issue 10, Pages 3111-3118

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsphotonics.1c01268

Keywords

total internal reflection; dark field microscopy; single particle tracking; light scattering; nanoparticles at fluid interfaces; colloidal flow at fluid interfaces

Funding

  1. ERC Consolidator grant [819593]
  2. EPSRC Leadership Fellowship [EP/T03419X/1]
  3. China Scholarship Council -University of Oxford scholarship
  4. MCSA individual fellowship
  5. European Research Council (ERC) [819593] Funding Source: European Research Council (ERC)

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Single particle tracking has broad applications in life and physical sciences, allowing observation and characterization of nano- and microscopic motion. This study demonstrates that micromirror-based total internal reflection dark field microscopy achieves efficient background suppression, with nanometer localization precision and high temporal resolution.
Single particle tracking has found broad applications in the life and physical sciences, enabling the observation and characterization of nano- and microscopic motion. Fluorescence-based approaches are ideally suited for high-background environments, such as tracking lipids or proteins in or on cells, due to superior background rejection. Scattering-based detection is preferable when localization precision and imaging speed are paramount due to the in principle infinite photon budget. Here, we show that micromirror-based total internal reflection dark field microscopy enables background suppression previously only reported for interferometric scattering microscopy, resulting in nanometer localization precision at 6 mu s exposure time for 20 nm gold nanoparticles with a 25 x 25 mu m(2) field of view. We demonstrate the capabilities of our implementation by characterizing sub-nanometer deterministic flows of 20 nm gold nanoparticles at liquid-liquid interfaces. Our results approach the optimal combination of background suppression, localization precision, and temporal resolution achievable with pure scattering-based imaging and tracking of nanoparticles at interfaces.

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