Journal
IEEE JOURNAL OF PHOTOVOLTAICS
Volume 12, Issue 1, Pages 381-387Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2021.3127465
Keywords
Temperature measurement; Humidity; Data models; Circuit faults; Training; Humidity measurement; Fault detection; Condition monitoring; electrical fault detection; modeling; photovoltaic systems; power system faults; reflectometry; spread spectrum time domain reflectometry (SSTDR)
Funding
- U.S. Department of Energy's Office of Energy Efficiency and Renewable Energy (EERE) through Solar Energy Technologies Office (SETO) [DE-EE0008169]
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This article investigates the effects of environmental factors on SSTDR measurements in photovoltaics, finding that illuminance, temperature, and humidity significantly impact reflections from panels. The research suggests using multiple baselines to prevent environmental variations from obscuring faults, and motivates future work in baseline prediction.
Current spread spectrum time-domain reflectometry (SSTDR) fault detection methods in photovoltaics compare measurements with a fault-free baselin. Yet, environmental factors, such as illuminance, temperature, and humidity, affect these signals and can negatively affect our ability to detect and locate faults. This article explains and quantifies the effects of environmental factors on SSTDR measurements. We demonstrate that illuminance, temperature, and humidity each significantly affect reflections from photovoltaic panels, which require the use of up to 240 baselines to prevent environmental variation from obscuring faults. We present a method to determine the number of required baselines in any given climate and motivate future work in baseline prediction.
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