4.6 Article

SiC Fin-Shaped Gate Trench MOSFET with Integrated Schottky Diode

Related references

Note: Only part of the references are listed.
Article Engineering, Electrical & Electronic

A low loss single-channel SiC trench MOSFET with integrated trench MOS barrier Schottky diode

Bo Yi et al.

Summary: In this paper, a novel single-channel SiC trench MOSFET with an integrated trench MOS barrier Schottky diode is proposed and investigated. The device effectively suppresses leakage current by reducing the electric field at the Schottky interface and reduces the on-state voltage drop. Additionally, improved performance metrics and optimized inductive switching loss are achieved.

SEMICONDUCTOR SCIENCE AND TECHNOLOGY (2021)

Article Engineering, Electrical & Electronic

Demonstration of Constant-Gate-Charge Scaling to Increase the Robustness of Silicon Carbide Power MOSFETs

James A. Cooper et al.

Summary: The concept of constant-gate-charge scaling is introduced to increase the short-circuit withstand time of SiC power MOSFETs by adjusting the oxide thickness and gate drive voltage, maintaining a constant oxide field. Experimental results on 1200V SiC double-implanted MOSFETs confirm that short-circuit withstand times can be increased by 2-4x simply by reducing the oxide thickness and the gate drive voltage without increasing ON-resistance.

IEEE TRANSACTIONS ON ELECTRON DEVICES (2021)

Article Engineering, Electrical & Electronic

Investigations of SiC MOSFET Short-Circuit Failure Mechanisms Using Electrical, Thermal, and Mechanical Stress Analyses

Kailun Yao et al.

IEEE TRANSACTIONS ON ELECTRON DEVICES (2020)

Review Energy & Fuels

Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review

Patrick Fiorenza et al.

ENERGIES (2019)

Article Engineering, Electrical & Electronic

SiC Trench MOSFET With Integrated Self-Assembled Three-Level Protection Schottky Barrier Diode

Xuan Li et al.

IEEE TRANSACTIONS ON ELECTRON DEVICES (2018)

Article Engineering, Electrical & Electronic

4H-SiC Trench MOSFET With Floating/Grounded Junction Barrier-controlled Gate Structure

Xintian Zhou et al.

IEEE TRANSACTIONS ON ELECTRON DEVICES (2017)

Review Automation & Control Systems

Review of Silicon Carbide Power Devices and Their Applications

Xu She et al.

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS (2017)

Article Automation & Control Systems

On Developing One-Chip Integration of 1.2 kV SiC MOSFET and JBS Diode (JBSFET)

Woongje Sung et al.

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS (2017)

Article Automation & Control Systems

A SiC Power MOSFET Loss Model Suitable for High-Frequency Applications

Xuan Li et al.

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS (2017)

Article Engineering, Electrical & Electronic

Monolithically Integrated 4H-SiC MOSFET and JBS Diode (JBSFET) Using a Single Ohmic/Schottky Process Scheme

Woongje Sung et al.

IEEE ELECTRON DEVICE LETTERS (2016)

Article Engineering, Electrical & Electronic

SiC Trench MOSFET With Shielded Fin-Shaped Gate to Reduce Oxide Field and Switching Loss

Huaping Jiang et al.

IEEE ELECTRON DEVICE LETTERS (2016)

Article Engineering, Electrical & Electronic

3.3-kV-Class 4H-SiC MeV-Implanted UMOSFET With Reduced Gate Oxide Field

Shinsuke Harada et al.

IEEE ELECTRON DEVICE LETTERS (2016)

Article Engineering, Electrical & Electronic

Novel Designed SiC Devices for High Power and High Efficiency Systems

Yasuki Mikamura et al.

IEEE TRANSACTIONS ON ELECTRON DEVICES (2015)

Article Engineering, Electrical & Electronic

On-state characteristics of SiC power UMOSFETs on 115-μm drift layers

Y Sui et al.

IEEE ELECTRON DEVICE LETTERS (2005)

Article Engineering, Electrical & Electronic

New unipolar switching power device figures of merit

AQ Huang

IEEE ELECTRON DEVICE LETTERS (2004)