Journal
MATERIALS
Volume 15, Issue 3, Pages -Publisher
MDPI
DOI: 10.3390/ma15031003
Keywords
rotary swaging; aluminium; copper; composite; microstructure; electric properties
Categories
Funding
- Grant Agency of the Czech Republic [19-15479S]
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This study aims to investigate the correlations between electric characteristics and selected structural features of newly designed Al/Cu laminated conductors manufactured via room temperature rotary swaging. The results showed that the electric resistivity was affected by grain size, bimodal grains' distribution, presence of twins, dislocation density, and area fractions of Al and Cu. The fabrication of laminates via rotary swaging introduced more advantageous combinations of electric and mechanical properties than conventional manufacturing techniques.
This study aims to characterize the correlations between electric characteristics and selected structural features of newly designed Al/Cu laminated conductors manufactured via room temperature rotary swaging. After swaging, the laminates with diameters of 15 mm were subjected to two different post-process annealing treatments. Structure analyses performed to evaluate the effects of thermomechanical processing were performed via scanning and transmission electron microscopies. Electric conductivity and resistivity of the laminates were experimentally measured and numerically simulated using models designed according to the real conditions. The results showed that the electric resistivity was affected by the grain size, bimodal grains' distribution (where observed), the presence of twins, and, last but not least, dislocation density. Among the influencing factors were the area fractions of Al and Cu at the cross-sections of the of the laminated conductors, too. The results revealed that fabrication of the laminate via the technology of rotary swaging introduced more advantageous combinations of electric and mechanical properties than fabrication by conventional manufacturing techniques. The lowest specific electric resistivity of 20.6 omega m x 10(-9) was measured for the laminated conductor subjected to the post-process annealing treatment at 350 degrees C, which imparted significant structure restoration (confirmed by the presence of fine, equiaxed, randomly oriented grains).
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